The class G4LowEnergyIonisation calculates the continuous energy loss
due to electron ionisation and
simulates
-ray production by electrons.
The
-electron
production
threshold for a given material,
, is used to separate
the continuous and the discrete parts of the process. The energy loss
of an electron with the incident energy,
, is expressed
via the sum over all atomic shells,
, and the integral over the energy,
,
of
-electrons:
![]() |
(11.19) |
![]() |
(11.20) |
The probability of emission of a
-electron with kinetic energy,
, from a sub-shell,
, of binding energy,
, as the
result of the interaction of
an incoming electron with kinetic energy,
,
is described by:
![]() |
(11.21) |
The value of the coefficient,
, for each element is obtained as a result
of the fit on the spectrum from the EEDL data for those
energies which are available in the database.
The values of
and
are chosen for each atomic shell
according to the spectrum of
-electrons in this shell. Note that
corresponds to the maximum of the spectrum, if the maximum does not coincide
with
.
The dependence of all 24 parameters on the incident energy,
,
is evaluated from a logarithmic interpolation (11.1).
The sampling of the final state proceeds in three steps.
First a shell is randomly selected, then the energy of the
-electron is sampled, finally
the angle of emission of the scattered electron and of the
-ray
is determined by energy-momentum conservation taken into account
electron motion on the atomic orbit.
The interaction leaves the atom in an excited state. The deexcitation of the atom is simulated as described in section 11.9. Sampling of the excitations is carried out for both the continuous and the discrete parts of the process.
30.09.1999 created by Alessandra Forti
07.02.2000 modified by Véronique Lefébure
08.03.2000 reviewed by Petteri Nieminen and Maria Grazia Pia
05.12.2001 modified by Vladimir Ivanchenko
13.05.2002 modified by Vladimir Ivanchenko